Adaptive Optimizable Gaussian Process Regression Linear Least Squares Regression Filtering Method for SEM Images

Adaptive Optimizable Gaussian Process Regression Linear Least Squares Regression Filtering Method for SEM Images

Scanning Electron Microscopy (SEM) images often suffer from noise contamination, which degrades image quality and affects further analysis. This research presents a complete approach to estimate their Signal-to-Noise Ratio (SNR) and noise variance (NV), and enhance image quality using NV-guided Wien...

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Bibliographic Details
Main Authors: Dominic Chee Yong Ong, Iksan Bukhori, Kok Swee Sim, Kok Beng Gan
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Access
Subjects:
Image processing
scanning electron microscope (SEM)
noise variance estimation
signal-to-noise ratio (SNR)
SNR estimation
machine learning
Online Access:https://ieeexplore.ieee.org/document/11015481/
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https://ieeexplore.ieee.org/document/11015481/

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