Development and Validation of Multi-Locus GWAS-Based KASP Markers for Maize <i>Ustilago maydis</i> Resistance

Development and Validation of Multi-Locus GWAS-Based KASP Markers for Maize <i>Ustilago maydis</i> Resistance

Corn smut, caused by <i>Ustilago maydis</i>, significantly threatens maize production. This study evaluated 199 maize inbred lines at the seedling stage under greenhouse conditions for resistance to <i>U. maydis</i>, identifying 39 highly resistant lines. A genome-wide associ...

Full description

Saved in:
Bibliographic Details
Main Authors: Tao Shen, Huawei Gao, Chao Wang, Yunxiao Zheng, Weibin Song, Peng Hou, Liying Zhu, Yongfeng Zhao, Wei Song, Jinjie Guo
Format: Article
Language:English
Published: MDPI AG 2025-07-01
Series:Plants
Subjects:
corn smut
disease index
candidate genes
haplotype combinations
marker-assisted selection
Online Access:https://www.mdpi.com/2223-7747/14/15/2315
Tags: Add Tag
No Tags, Be the first to tag this record!

Internet

https://www.mdpi.com/2223-7747/14/15/2315

Similar Items