Zhao, S., Wang, Q., An, T., & Qin, F. Study on a Simulation Method for IGBT Bonded Wire Cracking Under Power Cycling Conditions Considering the Effect of Damage Evolution. IEEE.
Chicago Style (17th ed.) CitationZhao, Shengjun, Qi Wang, Tong An, and Fei Qin. Study on a Simulation Method for IGBT Bonded Wire Cracking Under Power Cycling Conditions Considering the Effect of Damage Evolution. IEEE.
MLA (9th ed.) CitationZhao, Shengjun, et al. Study on a Simulation Method for IGBT Bonded Wire Cracking Under Power Cycling Conditions Considering the Effect of Damage Evolution. IEEE.
Warning: These citations may not always be 100% accurate.