Beam phase measuring deflectometry featuring physics-compliant object-image mapping
Phase measuring deflectometry has been proven as a competitive technique for measuring complex optical surfaces. However, the commonly used imaging model simply treats the light beam associated with each camera pixel as a single ray, which in turn leads to significant measurement errors for complex...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
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AIP Publishing LLC
2025-05-01
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| Series: | APL Photonics |
| Online Access: | http://dx.doi.org/10.1063/5.0249433 |
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| author | Yunuo Chen Xiangchao Zhang Wei Lang Ting Chen Xingman Niu Xiangqian Jiang |
| author_facet | Yunuo Chen Xiangchao Zhang Wei Lang Ting Chen Xingman Niu Xiangqian Jiang |
| author_sort | Yunuo Chen |
| collection | DOAJ |
| description | Phase measuring deflectometry has been proven as a competitive technique for measuring complex optical surfaces. However, the commonly used imaging model simply treats the light beam associated with each camera pixel as a single ray, which in turn leads to significant measurement errors for complex surfaces with high curvedness, low reflectivity, or nonideal specularity. To broaden the measurable scope of deflectometry, beam phase measuring deflectometry is proposed. A beam imaging model is developed by defining a discrete light field function and assigning a beam composed of a set of rays to each camera pixel. The conventional framework of the one-to-one mapping between the points on the screen, camera, and surface under test is broken through for the first time, enabling a direct physics-compliant description of the imaging process in deflectometric measurement. The flexibility of the imaging model is guaranteed by a set of tunable parameters, and the difficulty of intensity quantification of images is bypassed through phase rendering. The proposed method shows superior accuracy over traditional approaches for complex surfaces, which reduces the measurement errors from an order of micrometers to hundreds of nanometers, while maintaining numerical reliability and measurement efficiency. |
| format | Article |
| id | doaj-art-b2f398fb4c0b4a348a7314d69ef4307e |
| institution | Kabale University |
| issn | 2378-0967 |
| language | English |
| publishDate | 2025-05-01 |
| publisher | AIP Publishing LLC |
| record_format | Article |
| series | APL Photonics |
| spelling | doaj-art-b2f398fb4c0b4a348a7314d69ef4307e2025-08-20T03:37:30ZengAIP Publishing LLCAPL Photonics2378-09672025-05-01105056116056116-1110.1063/5.0249433Beam phase measuring deflectometry featuring physics-compliant object-image mappingYunuo Chen0Xiangchao Zhang1Wei Lang2Ting Chen3Xingman Niu4Xiangqian Jiang5Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing, School of Information Science and Technology, Fudan University, Shanghai 200438, ChinaShanghai Engineering Research Center of Ultra-Precision Optical Manufacturing, School of Information Science and Technology, Fudan University, Shanghai 200438, ChinaShanghai Engineering Research Center of Ultra-Precision Optical Manufacturing, School of Information Science and Technology, Fudan University, Shanghai 200438, ChinaShanghai Engineering Research Center of Ultra-Precision Optical Manufacturing, School of Information Science and Technology, Fudan University, Shanghai 200438, ChinaShanghai Engineering Research Center of Ultra-Precision Optical Manufacturing, School of Information Science and Technology, Fudan University, Shanghai 200438, ChinaFuture Metrology Hub, University of Huddersfield, Huddersfield HD1 3DH, United KingdomPhase measuring deflectometry has been proven as a competitive technique for measuring complex optical surfaces. However, the commonly used imaging model simply treats the light beam associated with each camera pixel as a single ray, which in turn leads to significant measurement errors for complex surfaces with high curvedness, low reflectivity, or nonideal specularity. To broaden the measurable scope of deflectometry, beam phase measuring deflectometry is proposed. A beam imaging model is developed by defining a discrete light field function and assigning a beam composed of a set of rays to each camera pixel. The conventional framework of the one-to-one mapping between the points on the screen, camera, and surface under test is broken through for the first time, enabling a direct physics-compliant description of the imaging process in deflectometric measurement. The flexibility of the imaging model is guaranteed by a set of tunable parameters, and the difficulty of intensity quantification of images is bypassed through phase rendering. The proposed method shows superior accuracy over traditional approaches for complex surfaces, which reduces the measurement errors from an order of micrometers to hundreds of nanometers, while maintaining numerical reliability and measurement efficiency.http://dx.doi.org/10.1063/5.0249433 |
| spellingShingle | Yunuo Chen Xiangchao Zhang Wei Lang Ting Chen Xingman Niu Xiangqian Jiang Beam phase measuring deflectometry featuring physics-compliant object-image mapping APL Photonics |
| title | Beam phase measuring deflectometry featuring physics-compliant object-image mapping |
| title_full | Beam phase measuring deflectometry featuring physics-compliant object-image mapping |
| title_fullStr | Beam phase measuring deflectometry featuring physics-compliant object-image mapping |
| title_full_unstemmed | Beam phase measuring deflectometry featuring physics-compliant object-image mapping |
| title_short | Beam phase measuring deflectometry featuring physics-compliant object-image mapping |
| title_sort | beam phase measuring deflectometry featuring physics compliant object image mapping |
| url | http://dx.doi.org/10.1063/5.0249433 |
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