Beam phase measuring deflectometry featuring physics-compliant object-image mapping

Phase measuring deflectometry has been proven as a competitive technique for measuring complex optical surfaces. However, the commonly used imaging model simply treats the light beam associated with each camera pixel as a single ray, which in turn leads to significant measurement errors for complex...

Full description

Saved in:
Bibliographic Details
Main Authors: Yunuo Chen, Xiangchao Zhang, Wei Lang, Ting Chen, Xingman Niu, Xiangqian Jiang
Format: Article
Language:English
Published: AIP Publishing LLC 2025-05-01
Series:APL Photonics
Online Access:http://dx.doi.org/10.1063/5.0249433
Tags: Add Tag
No Tags, Be the first to tag this record!