Evaluating the Output Performance of the Semiconductor Bridge Through Principal Component Analysis
The complex burst characteristic parameters of SCB were subjected to dimensionality reduction using principal component analysis (PCA), enabling accurate evaluation of the output performance of SCB. The accuracy and reliability of the PCA method were also validated. A 100 μF tantalum capacitor was u...
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| Main Authors: | Limei Zhang, Yongqi Da, Wei Zhang, Fuwei Li, Jianbing Xu, Li Jing, Qun Liu, Yinghua Ye, Ruiqi Shen |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-04-01
|
| Series: | Nanomaterials |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-4991/15/9/672 |
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