Evaluating the Output Performance of the Semiconductor Bridge Through Principal Component Analysis

Evaluating the Output Performance of the Semiconductor Bridge Through Principal Component Analysis

The complex burst characteristic parameters of SCB were subjected to dimensionality reduction using principal component analysis (PCA), enabling accurate evaluation of the output performance of SCB. The accuracy and reliability of the PCA method were also validated. A 100 μF tantalum capacitor was u...

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Bibliographic Details
Main Authors: Limei Zhang, Yongqi Da, Wei Zhang, Fuwei Li, Jianbing Xu, Li Jing, Qun Liu, Yinghua Ye, Ruiqi Shen
Format: Article
Language:English
Published: MDPI AG 2025-04-01
Series:Nanomaterials
Subjects:
semiconductor bridge
electric explosion parameter
output capacity
principal component analysis
Online Access:https://www.mdpi.com/2079-4991/15/9/672
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