Topological and Fractal Analysis of Nanostructured Metal–Dielectric Films
The surface topology and fractal dimension of ultrathin silver and gold films have been investigated utilizing atomic force microscopy. These films were formed at the early stages of metal deposition through thermal evaporation and have pre-percolation thicknesses. They contain both metallic and ins...
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2025-03-01
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| author | Ivan Bolesta Oleksii Kushnir Ivan Karbovnyk Halyna Klym Marina Konuhova Anatoli I. Popov |
| author_facet | Ivan Bolesta Oleksii Kushnir Ivan Karbovnyk Halyna Klym Marina Konuhova Anatoli I. Popov |
| author_sort | Ivan Bolesta |
| collection | DOAJ |
| description | The surface topology and fractal dimension of ultrathin silver and gold films have been investigated utilizing atomic force microscopy. These films were formed at the early stages of metal deposition through thermal evaporation and have pre-percolation thicknesses. They contain both metallic and insulating (void) phases, making them metal–dielectric composites. We identified the main parameters of the microstructure, such as the size of the metallic particles and surface roughness, as well as the dependence of these parameters on the film thickness and substrate parameters. Approaches to processing data, including correlation analysis, were employed. An analysis of dependencies and an explanation of their appearance were conducted. The discussion also addressed the limitations of using atomic force microscopy for studying ultrathin metal films. We determined the various types of fractal dimensions, considering the film topology for two- as well as three-dimensional objects. Depending on the actual dimensions of the phase boundary for silver films, a maximum was found. Different approaches to determining the fractal dimensions in 3Ds case show a similar dependence, but different values. |
| format | Article |
| id | doaj-art-b11733011613423e9dbe4599c698ae24 |
| institution | OA Journals |
| issn | 2076-3417 |
| language | English |
| publishDate | 2025-03-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Applied Sciences |
| spelling | doaj-art-b11733011613423e9dbe4599c698ae242025-08-20T02:11:04ZengMDPI AGApplied Sciences2076-34172025-03-01156325010.3390/app15063250Topological and Fractal Analysis of Nanostructured Metal–Dielectric FilmsIvan Bolesta0Oleksii Kushnir1Ivan Karbovnyk2Halyna Klym3Marina Konuhova4Anatoli I. Popov5Department of Radiophysics and Computer Technologies, Ivan Franko National University of Lviv, 107 Tarnavskogo Str., 79017 Lviv, UkraineDepartment of Radiophysics and Computer Technologies, Ivan Franko National University of Lviv, 107 Tarnavskogo Str., 79017 Lviv, UkraineDepartment of Radiophysics and Computer Technologies, Ivan Franko National University of Lviv, 107 Tarnavskogo Str., 79017 Lviv, UkraineDepartment of Specialized Computer Systems, Lviv Polytechnic National University, 12 Bandera Str., 79013 Lviv, UkraineInstitute of Solid State Physics, University of Latvia, Kengaraga 8, LV-1063 Riga, LatviaInstitute of Solid State Physics, University of Latvia, Kengaraga 8, LV-1063 Riga, LatviaThe surface topology and fractal dimension of ultrathin silver and gold films have been investigated utilizing atomic force microscopy. These films were formed at the early stages of metal deposition through thermal evaporation and have pre-percolation thicknesses. They contain both metallic and insulating (void) phases, making them metal–dielectric composites. We identified the main parameters of the microstructure, such as the size of the metallic particles and surface roughness, as well as the dependence of these parameters on the film thickness and substrate parameters. Approaches to processing data, including correlation analysis, were employed. An analysis of dependencies and an explanation of their appearance were conducted. The discussion also addressed the limitations of using atomic force microscopy for studying ultrathin metal films. We determined the various types of fractal dimensions, considering the film topology for two- as well as three-dimensional objects. Depending on the actual dimensions of the phase boundary for silver films, a maximum was found. Different approaches to determining the fractal dimensions in 3Ds case show a similar dependence, but different values.https://www.mdpi.com/2076-3417/15/6/3250atomic force microscopythin filmstopologysurfacenanostructuresfractal |
| spellingShingle | Ivan Bolesta Oleksii Kushnir Ivan Karbovnyk Halyna Klym Marina Konuhova Anatoli I. Popov Topological and Fractal Analysis of Nanostructured Metal–Dielectric Films Applied Sciences atomic force microscopy thin films topology surface nanostructures fractal |
| title | Topological and Fractal Analysis of Nanostructured Metal–Dielectric Films |
| title_full | Topological and Fractal Analysis of Nanostructured Metal–Dielectric Films |
| title_fullStr | Topological and Fractal Analysis of Nanostructured Metal–Dielectric Films |
| title_full_unstemmed | Topological and Fractal Analysis of Nanostructured Metal–Dielectric Films |
| title_short | Topological and Fractal Analysis of Nanostructured Metal–Dielectric Films |
| title_sort | topological and fractal analysis of nanostructured metal dielectric films |
| topic | atomic force microscopy thin films topology surface nanostructures fractal |
| url | https://www.mdpi.com/2076-3417/15/6/3250 |
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