Topological and Fractal Analysis of Nanostructured Metal–Dielectric Films
The surface topology and fractal dimension of ultrathin silver and gold films have been investigated utilizing atomic force microscopy. These films were formed at the early stages of metal deposition through thermal evaporation and have pre-percolation thicknesses. They contain both metallic and ins...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-03-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/15/6/3250 |
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