Point Defect Detection and Classification in MoS<sub>2</sub> Scanning Tunneling Microscopy Images: A Deep Learning Approach
Point defects in two-dimensional materials such as MoS<sub>2</sub> can critically impact their electronic and optoelectronic properties. Precise identification of these defects is essential for understanding defect physics and device performance. In this work, we acquire high-resolution...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-06-01
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| Series: | Molecules |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1420-3049/30/12/2644 |
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