Algorithm for Reproducible Analysis of Semiconducting 2D Nanomaterials Based on UV‐VIS Spectroscopy
Abstract Rapid and reliable analysis of liquid dispersions of 2D materials is essential for fully harnessing their potential, allowing size and quality validation before subsequent processing or device fabrication. Existing UV‐VIS extinction spectroscopy‐based metrics, particularly those related to...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley-VCH
2024-12-01
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| Series: | Advanced Materials Interfaces |
| Subjects: | |
| Online Access: | https://doi.org/10.1002/admi.202400311 |
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