DeFRCN-MAM: DeFRCN and multi-scale attention mechanism-based industrial defect detection method

With the technology development, industrial defect detection based on deep learning has attracted extensive attention in the academic community. Different from general visual objects, industrial defects have the characteristics of small sample, weak visibility and irregular shape, which hinder the a...

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Bibliographic Details
Main Authors: Tong Zheng, Liangbing Sa, Chongchong Yu, Aibin Song
Format: Article
Language:English
Published: Taylor & Francis Group 2024-12-01
Series:Applied Artificial Intelligence
Online Access:https://www.tandfonline.com/doi/10.1080/08839514.2024.2349981
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