APA (7th ed.) Citation

Chemello, G., Despotelis, K., Paton, K. R., Clifford, C. A., Pollard, A. J., Radnik, J., & Hodoroaba, V. Approaches for the measurement of lateral dimensions of graphene oxide flakes using scanning electron microscopy. IOP Publishing.

Chicago Style (17th ed.) Citation

Chemello, Giovanni, Konstantinos Despotelis, Keith R. Paton, Charles A. Clifford, Andrew J. Pollard, Jörg Radnik, and Vasile-Dan Hodoroaba. Approaches for the Measurement of Lateral Dimensions of Graphene Oxide Flakes Using Scanning Electron Microscopy. IOP Publishing.

MLA (9th ed.) Citation

Chemello, Giovanni, et al. Approaches for the Measurement of Lateral Dimensions of Graphene Oxide Flakes Using Scanning Electron Microscopy. IOP Publishing.