Approaches for the measurement of lateral dimensions of graphene oxide flakes using scanning electron microscopy

Approaches for the measurement of lateral dimensions of graphene oxide flakes using scanning electron microscopy

There is a practical need, especially from the industrial community, to accurately measure the size and shape of graphene oxide (GO) flakes of commercial origin, in a reliable, simple, and unambiguous way. The sample preparation is a decisive step to obtain a homogeneous distribution of flakes on a...

Full description

Saved in:
Bibliographic Details
Main Authors: Giovanni Chemello, Konstantinos Despotelis, Keith R Paton, Charles A Clifford, Andrew J Pollard, Jörg Radnik, Vasile-Dan Hodoroaba
Format: Article
Language:English
Published: IOP Publishing 2025-01-01
Series:Nano Express
Subjects:
graphene oxide
SEM
lateral dimension
standardization
imaging
Online Access:https://doi.org/10.1088/2632-959X/adae28
Tags: Add Tag
No Tags, Be the first to tag this record!

Internet

https://doi.org/10.1088/2632-959X/adae28

Similar Items