Kim, Y., Park, H., Yoon, S., & Kang, H. Evaluating current sensing methods for accurate characterization in small chip size SiC MOSFETs. Elsevier.
Chicago Style (17th ed.) CitationKim, Y., H. Park, S. Yoon, and H. Kang. Evaluating Current Sensing Methods for Accurate Characterization in Small Chip Size SiC MOSFETs. Elsevier.
MLA (9th ed.) CitationKim, Y., et al. Evaluating Current Sensing Methods for Accurate Characterization in Small Chip Size SiC MOSFETs. Elsevier.
Warning: These citations may not always be 100% accurate.