A Comparative Analysis of Artificial Intelligence Techniques for Single Open-Circuit Fault Detection in a Packed E-Cell Inverter

A Comparative Analysis of Artificial Intelligence Techniques for Single Open-Circuit Fault Detection in a Packed E-Cell Inverter

Recently, fault detection has played a crucial role in ensuring the safety and reliability of inverter operation. Switch failures are primarily classified into Open-Circuit (OC) and short-circuit faults. While OC failures have limited negative impacts, prolonged system operation under such condition...

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Bibliographic Details
Main Authors: Bushra Masri, Hiba Al Sheikh, Nabil Karami, Hadi Y. Kanaan, Nazih Moubayed
Format: Article
Language:English
Published: MDPI AG 2025-03-01
Series:Energies
Subjects:
wavelet analysis
feature extraction
switching faults
random forest decision tree
feed-forward neural network
fault detection
Online Access:https://www.mdpi.com/1996-1073/18/6/1312
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