APA (7th ed.) Citation

He, H., Wei, Y., Lin, X., Zhu, M., & Zhang, H. Semiconductor Wafer Defect Recognition Based on Improved Coordinate Attention Mechanism. IEEE.

Chicago Style (17th ed.) Citation

He, Hao, Yuanjie Wei, Xionghao Lin, Minmin Zhu, and Haizhong Zhang. Semiconductor Wafer Defect Recognition Based on Improved Coordinate Attention Mechanism. IEEE.

MLA (9th ed.) Citation

He, Hao, et al. Semiconductor Wafer Defect Recognition Based on Improved Coordinate Attention Mechanism. IEEE.