Effect of Gate Length Scaling on Various Performance Parameters in DG-FinFETs: a Simulation Study

This paper presents a simulation study on the gate length scaling of a double gate (DG) FinFET. To achieve channel lengths smaller than 20 nm, innovative device architectures will be necessary to continue the benefits previously acquired through scaling. In order to obtain desirable control of short...

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Bibliographic Details
Main Authors: Rakesh Vaid, Meenakshi Chandel
Format: Article
Language:English
Published: Sumy State University 2012-10-01
Series:Журнал нано- та електронної фізики
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Online Access:http://jnep.sumdu.edu.ua/download/numbers/2012/3/articles/jnep_2012_V4_03007.pdf
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