A Reference Voltage Loop Operation Based ZQ Calibration Technique for Multi-Load High- Capacity NAND Flash Memory Interface
This paper proposes a novel ZQ calibration method based on a reference voltage loop operation. ZQ calibration technology improves the integrity of signals transmitted on the channel by calibrating on-die termination (ODT) and output driver strength, which vary with process, voltage, and temperature...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/11007586/ |
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