A Reference Voltage Loop Operation Based ZQ Calibration Technique for Multi-Load High- Capacity NAND Flash Memory Interface

A Reference Voltage Loop Operation Based ZQ Calibration Technique for Multi-Load High- Capacity NAND Flash Memory Interface

This paper proposes a novel ZQ calibration method based on a reference voltage loop operation. ZQ calibration technology improves the integrity of signals transmitted on the channel by calibrating on-die termination (ODT) and output driver strength, which vary with process, voltage, and temperature...

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Bibliographic Details
Main Authors: Jun-Ha Lee, Jun-Eun Park, Dong-Ho Shin, Kang-Yoon Lee
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Access
Subjects:
3D-NAND flash
memory interface
ZQ calibration
multi-die package (MDP)
low-tapped termination (LTT)
center-tapped termination (CTT)
Online Access:https://ieeexplore.ieee.org/document/11007586/
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https://ieeexplore.ieee.org/document/11007586/

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