Elimination of Double‐Slope Nonideality in C60 Field Effect Transistors

Abstract Double‐slope nonideality, widely observed in organic field‐effect transistors (OFETs), leads to inaccurate extraction of field‐effect mobility, hindering the evaluation of new organic semiconductors and limiting OFET applications. This study presents a solution to this issue in n‐type OFETs...

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Bibliographic Details
Main Authors: Xingwei Zeng, Xinyi Zhao, Jianbin Xu, Qian Miao
Format: Article
Language:English
Published: Wiley-VCH 2025-08-01
Series:Advanced Electronic Materials
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Online Access:https://doi.org/10.1002/aelm.202500101
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