Interface‐Specific Excitation of Coherent Phonons at the Buried GaP/Si(001) Heterointerface

Abstract Ultrafast charge‐carrier and phonon dynamics at the buried heterointerface of GaP/Si(001) are investigated by means of two‐color pump‐probe reflectivity measurements. The carrier‐induced reflectivity signal exhibits a resonant enhancement at a pump‐photon energy of 1.4 eV, which is assigned...

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Main Authors: Gerson Mette, Kunie Ishioka, Steven Youngkin, Wolfgang Stolz, Kerstin Volz, Ulrich Höfer
Format: Article
Language:English
Published: Wiley-VCH 2025-04-01
Series:Advanced Materials Interfaces
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Online Access:https://doi.org/10.1002/admi.202400573
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_version_ 1849701454573469696
author Gerson Mette
Kunie Ishioka
Steven Youngkin
Wolfgang Stolz
Kerstin Volz
Ulrich Höfer
author_facet Gerson Mette
Kunie Ishioka
Steven Youngkin
Wolfgang Stolz
Kerstin Volz
Ulrich Höfer
author_sort Gerson Mette
collection DOAJ
description Abstract Ultrafast charge‐carrier and phonon dynamics at the buried heterointerface of GaP/Si(001) are investigated by means of two‐color pump‐probe reflectivity measurements. The carrier‐induced reflectivity signal exhibits a resonant enhancement at a pump‐photon energy of 1.4 eV, which is assigned to an optical transition at the interface. In addition, the transient reflectivity is modulated by a coherent oscillation at 2 THz, whose amplitude also becomes maximum at 1.4 eV. The observed resonant behavior of the oscillation, in combination with the characteristic wavelength‐dependencies of its frequency and its initial phase, strongly indicates that the 2‐THz mode is a difference‐combination mode between a GaP‐like and a Si‐like phonon at the heterointerface and that the corresponding second‐order Raman scattering process can be enhanced by a double resonance involving the interfacial electronic states.
format Article
id doaj-art-a0ffd228a7ec464db17acea8e3be496a
institution DOAJ
issn 2196-7350
language English
publishDate 2025-04-01
publisher Wiley-VCH
record_format Article
series Advanced Materials Interfaces
spelling doaj-art-a0ffd228a7ec464db17acea8e3be496a2025-08-20T03:17:55ZengWiley-VCHAdvanced Materials Interfaces2196-73502025-04-01127n/an/a10.1002/admi.202400573Interface‐Specific Excitation of Coherent Phonons at the Buried GaP/Si(001) HeterointerfaceGerson Mette0Kunie Ishioka1Steven Youngkin2Wolfgang Stolz3Kerstin Volz4Ulrich Höfer5Faculty of Physics and Materials Sciences Center Philipps‐Universität Marburg 35032 Marburg GermanyNational Institute for Materials Science Tsukuba 305‐0047 JapanFaculty of Physics and Materials Sciences Center Philipps‐Universität Marburg 35032 Marburg GermanyFaculty of Physics and Materials Sciences Center Philipps‐Universität Marburg 35032 Marburg GermanyFaculty of Physics and Materials Sciences Center Philipps‐Universität Marburg 35032 Marburg GermanyFaculty of Physics and Materials Sciences Center Philipps‐Universität Marburg 35032 Marburg GermanyAbstract Ultrafast charge‐carrier and phonon dynamics at the buried heterointerface of GaP/Si(001) are investigated by means of two‐color pump‐probe reflectivity measurements. The carrier‐induced reflectivity signal exhibits a resonant enhancement at a pump‐photon energy of 1.4 eV, which is assigned to an optical transition at the interface. In addition, the transient reflectivity is modulated by a coherent oscillation at 2 THz, whose amplitude also becomes maximum at 1.4 eV. The observed resonant behavior of the oscillation, in combination with the characteristic wavelength‐dependencies of its frequency and its initial phase, strongly indicates that the 2‐THz mode is a difference‐combination mode between a GaP‐like and a Si‐like phonon at the heterointerface and that the corresponding second‐order Raman scattering process can be enhanced by a double resonance involving the interfacial electronic states.https://doi.org/10.1002/admi.202400573buried heterointerfacecoherent phononsexperimentGaP/Si(001)interface phononpump‐probe
spellingShingle Gerson Mette
Kunie Ishioka
Steven Youngkin
Wolfgang Stolz
Kerstin Volz
Ulrich Höfer
Interface‐Specific Excitation of Coherent Phonons at the Buried GaP/Si(001) Heterointerface
Advanced Materials Interfaces
buried heterointerface
coherent phonons
experiment
GaP/Si(001)
interface phonon
pump‐probe
title Interface‐Specific Excitation of Coherent Phonons at the Buried GaP/Si(001) Heterointerface
title_full Interface‐Specific Excitation of Coherent Phonons at the Buried GaP/Si(001) Heterointerface
title_fullStr Interface‐Specific Excitation of Coherent Phonons at the Buried GaP/Si(001) Heterointerface
title_full_unstemmed Interface‐Specific Excitation of Coherent Phonons at the Buried GaP/Si(001) Heterointerface
title_short Interface‐Specific Excitation of Coherent Phonons at the Buried GaP/Si(001) Heterointerface
title_sort interface specific excitation of coherent phonons at the buried gap si 001 heterointerface
topic buried heterointerface
coherent phonons
experiment
GaP/Si(001)
interface phonon
pump‐probe
url https://doi.org/10.1002/admi.202400573
work_keys_str_mv AT gersonmette interfacespecificexcitationofcoherentphononsattheburiedgapsi001heterointerface
AT kunieishioka interfacespecificexcitationofcoherentphononsattheburiedgapsi001heterointerface
AT stevenyoungkin interfacespecificexcitationofcoherentphononsattheburiedgapsi001heterointerface
AT wolfgangstolz interfacespecificexcitationofcoherentphononsattheburiedgapsi001heterointerface
AT kerstinvolz interfacespecificexcitationofcoherentphononsattheburiedgapsi001heterointerface
AT ulrichhofer interfacespecificexcitationofcoherentphononsattheburiedgapsi001heterointerface