ON THE TECHNIQUE OF PREPARING SAMPLES TO STUDY FRACTAL DIMENSION AND ELECTRICAL PROPERTIES OF SAMPLES USING A SCANNING TUNNELING MICROSCOPE
In this paper the technique of preparation of samples for the study of fractal dimension and obtaining the current-voltage characteristics using a scanning tunneling microscope has been demonstrated.
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| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | Russian |
| Published: |
Tver State University
2014-11-01
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| Series: | Физико-химические аспекты изучения кластеров, наноструктур и наноматериалов |
| Subjects: | |
| Online Access: | https://physchemaspects.ru/2014/doi-10-26456-pcascnn-2014-6-015/?lang=en |
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