Performance study of UV micro-LEDs with AlGaN quantum dots and transparent tunnel junction

It is well known that the size of deep ultraviolet (DUV) micro LED (μLEDs) decreases, although bandwidth improves, the optical power drops sharply, severely limiting the application of DUV μLEDs in optical communication. This study focused on the fabrication of DUV μLED with 10 μm × 10 μm dimenstion...

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Main Authors: Yun-Cheng Hsu, Ching-Ho Tien, Yun-Han Chang, Sunanda Mitra, Sankesh Shetty, Sébastien Chenot, Mohamed Al Khalfioui, Hao-Chung Kuo, Chi-Wai Chow, Chia-Yen Huang, Julien Brault, Ray-Hua Horng
Format: Article
Language:English
Published: Elsevier 2025-01-01
Series:Next Nanotechnology
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Online Access:http://www.sciencedirect.com/science/article/pii/S2949829525000488
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author Yun-Cheng Hsu
Ching-Ho Tien
Yun-Han Chang
Sunanda Mitra
Sankesh Shetty
Sébastien Chenot
Mohamed Al Khalfioui
Hao-Chung Kuo
Chi-Wai Chow
Chia-Yen Huang
Julien Brault
Ray-Hua Horng
author_facet Yun-Cheng Hsu
Ching-Ho Tien
Yun-Han Chang
Sunanda Mitra
Sankesh Shetty
Sébastien Chenot
Mohamed Al Khalfioui
Hao-Chung Kuo
Chi-Wai Chow
Chia-Yen Huang
Julien Brault
Ray-Hua Horng
author_sort Yun-Cheng Hsu
collection DOAJ
description It is well known that the size of deep ultraviolet (DUV) micro LED (μLEDs) decreases, although bandwidth improves, the optical power drops sharply, severely limiting the application of DUV μLEDs in optical communication. This study focused on the fabrication of DUV μLED with 10 μm × 10 μm dimenstion, utilizing molecular beam epitaxy (MBE) technology to grow AlGaN quantum dots (QD) and improve the stress in the quantum dot structure through stress engineering, thereby enhancing the light emission efficiency. To improve the ohmic contact in the p-type region, a tunneling structure is designed and incorporated, which helps increase carrier injection efficiency and further optimize the electrical performance of device. Additionally, by combining neutral particle beam etching (NBE) technology, the μLED is precisely processed, suppressing the processing damage that typically reduces light emission efficiency in conventional dry etching methods. Test results demonstrate that the integration of these technologies significantly improves the optoelectronic properties of the DUV μLED with 10 μm × 10 μm dimenstion, providing a reliable technical solution for DUV communication applications.
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institution OA Journals
issn 2949-8295
language English
publishDate 2025-01-01
publisher Elsevier
record_format Article
series Next Nanotechnology
spelling doaj-art-9c425806838342d9940488cdcd66b2d72025-08-20T02:10:03ZengElsevierNext Nanotechnology2949-82952025-01-01710017910.1016/j.nxnano.2025.100179Performance study of UV micro-LEDs with AlGaN quantum dots and transparent tunnel junctionYun-Cheng Hsu0Ching-Ho Tien1Yun-Han Chang2Sunanda Mitra3Sankesh Shetty4Sébastien Chenot5Mohamed Al Khalfioui6Hao-Chung Kuo7Chi-Wai Chow8Chia-Yen Huang9Julien Brault10Ray-Hua Horng11Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan, ROCDepartment of Electrical Engineering, Tunghai University, Taichung City 407224, Taiwan, ROCDepartment of Photonics, College of Electrical and Computer Engineering, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan, ROCUniversité Côte d’Azur, CNRS, CRHEA, rue Bernard Grégory, Sophia Antipolis 06905, FranceUniversité Côte d’Azur, CNRS, CRHEA, rue Bernard Grégory, Sophia Antipolis 06905, FranceUniversité Côte d’Azur, CNRS, CRHEA, rue Bernard Grégory, Sophia Antipolis 06905, FranceUniversité Côte d’Azur, CNRS, CRHEA, rue Bernard Grégory, Sophia Antipolis 06905, FranceDepartment of Photonics, College of Electrical and Computer Engineering, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan, ROCDepartment of Photonics, College of Electrical and Computer Engineering, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan, ROCDepartment of Photonics, College of Electrical and Computer Engineering, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan, ROCUniversité Côte d’Azur, CNRS, CRHEA, rue Bernard Grégory, Sophia Antipolis 06905, FranceInstitute of Electronics, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan, ROC; Thin Film Physics Division, Department of Physics, Chemistry and Biology (IFM), Linköping University, Linköping SE-581 83, Sweden; Corresponding author at: Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan, ROC.It is well known that the size of deep ultraviolet (DUV) micro LED (μLEDs) decreases, although bandwidth improves, the optical power drops sharply, severely limiting the application of DUV μLEDs in optical communication. This study focused on the fabrication of DUV μLED with 10 μm × 10 μm dimenstion, utilizing molecular beam epitaxy (MBE) technology to grow AlGaN quantum dots (QD) and improve the stress in the quantum dot structure through stress engineering, thereby enhancing the light emission efficiency. To improve the ohmic contact in the p-type region, a tunneling structure is designed and incorporated, which helps increase carrier injection efficiency and further optimize the electrical performance of device. Additionally, by combining neutral particle beam etching (NBE) technology, the μLED is precisely processed, suppressing the processing damage that typically reduces light emission efficiency in conventional dry etching methods. Test results demonstrate that the integration of these technologies significantly improves the optoelectronic properties of the DUV μLED with 10 μm × 10 μm dimenstion, providing a reliable technical solution for DUV communication applications.http://www.sciencedirect.com/science/article/pii/S2949829525000488DUV Micro-LEDNeutral particle beam etchingOptical wireless communication
spellingShingle Yun-Cheng Hsu
Ching-Ho Tien
Yun-Han Chang
Sunanda Mitra
Sankesh Shetty
Sébastien Chenot
Mohamed Al Khalfioui
Hao-Chung Kuo
Chi-Wai Chow
Chia-Yen Huang
Julien Brault
Ray-Hua Horng
Performance study of UV micro-LEDs with AlGaN quantum dots and transparent tunnel junction
Next Nanotechnology
DUV Micro-LED
Neutral particle beam etching
Optical wireless communication
title Performance study of UV micro-LEDs with AlGaN quantum dots and transparent tunnel junction
title_full Performance study of UV micro-LEDs with AlGaN quantum dots and transparent tunnel junction
title_fullStr Performance study of UV micro-LEDs with AlGaN quantum dots and transparent tunnel junction
title_full_unstemmed Performance study of UV micro-LEDs with AlGaN quantum dots and transparent tunnel junction
title_short Performance study of UV micro-LEDs with AlGaN quantum dots and transparent tunnel junction
title_sort performance study of uv micro leds with algan quantum dots and transparent tunnel junction
topic DUV Micro-LED
Neutral particle beam etching
Optical wireless communication
url http://www.sciencedirect.com/science/article/pii/S2949829525000488
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