Sianko, S. F., & Zelenin, V. A. ESTIMATION OF TOPOGRAPHIC DEFECTS DIMENSIONS OF SEMICONDUCTOR SILICON STRUCTURES. Belarusian National Technical University.
Chicago Style (17th ed.) CitationSianko, S. F., and V. A. Zelenin. ESTIMATION OF TOPOGRAPHIC DEFECTS DIMENSIONS OF SEMICONDUCTOR SILICON STRUCTURES. Belarusian National Technical University.
MLA (9th ed.) CitationSianko, S. F., and V. A. Zelenin. ESTIMATION OF TOPOGRAPHIC DEFECTS DIMENSIONS OF SEMICONDUCTOR SILICON STRUCTURES. Belarusian National Technical University.
Warning: These citations may not always be 100% accurate.