Influence of Series Massive Resistance on Capacitance and Conductance Characteristics in Gate-Recessed Nanoscale SOI MOSFETs

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Bibliographic Details
Main Authors: Avraham Karsenty, Avraham Chelly
Format: Article
Language:English
Published: Wiley 2013-01-01
Series:Active and Passive Electronic Components
Online Access:http://dx.doi.org/10.1155/2013/813518
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