Investigation of the optical and electrical properties of zinc oxide by terahertz time domain ellipsometry

Investigation of the optical and electrical properties of zinc oxide by terahertz time domain ellipsometry

In order to demonstrate the application of terahertz time-domain ellipsometry (THz-TDE) in the characterization of wide-bandgap semiconductors, we studied two zinc oxide (ZnO) single crystals with different conductivities. The optical properties of ZnO samples with low conductivity and high conducti...

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Bibliographic Details
Main Authors: Zixi Zhao, Verdad C. Agulto, Toshiyuki Iwamoto, Kosaku Kato, Kohei Yamanoi, Toshihiko Shimizu, Nobuhiko Sarukura, Takashi Fujii, Tsuguo Fukuda, Masashi Yoshimura, Makoto Nakajima
Format: Article
Language:English
Published: Elsevier 2024-12-01
Series:Optical Materials: X
Subjects:
Terahertz
Ellipsometry
Zinc oxide
Semiconductor characterization
Online Access:http://www.sciencedirect.com/science/article/pii/S2590147824000640
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