Defects Detection in Screen-Printed Circuits Based on an Enhanced YOLOv8n Algorithm
Abstract Defect detection is a crucial task in screen-printed circuit (SPC) production, where image processing method based on deep learning is often used. This field frequently encounters challenges, such as minute surface defects, a large number of model parameters, and high computational complexi...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Springer
2025-05-01
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| Series: | International Journal of Computational Intelligence Systems |
| Subjects: | |
| Online Access: | https://doi.org/10.1007/s44196-025-00815-6 |
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