LE-YOLO: A Lightweight and Enhanced Algorithm for Detecting Surface Defects on Particleboard
Current algorithms for surface defect detection in particleboard often encounter limitations such as high computational complexity and excessive parameter scale. To address these challenges, this study proposes the LE-YOLO model, which incorporates a normalized Wasserstein distance into the loss fun...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
North Carolina State University
2025-07-01
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| Series: | BioResources |
| Subjects: | |
| Online Access: | https://ojs.bioresources.com/index.php/BRJ/article/view/24732 |
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