Research on reliability of capacitors and transistors based on BP neural network and Icepak simulation

Research on reliability of capacitors and transistors based on BP neural network and Icepak simulation

Abstract Electronic components such as capacitors and transistors play critical roles in aerospace, military, and communication systems, where long-term reliability is essential. However, long-life components often lack complete degradation data, and traditional accelerated life testing (ALT) method...

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Bibliographic Details
Main Authors: Yi He, Xiaoqing Yang, Xiaoyu Zhai
Format: Article
Language:English
Published: Nature Portfolio 2025-06-01
Series:Scientific Reports
Subjects:
Component simulation
BP neural network
Remaining useful life prediction
Arrhenius model
Icepak thermal simulation
Online Access:https://doi.org/10.1038/s41598-025-05050-9
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https://doi.org/10.1038/s41598-025-05050-9

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