Genetic dissection of leaf rust resistance in a diversity panel of tetraploid wheat (Triticum turgidum)

Abstract Background Leaf rust, caused by Puccinia triticina Eriks (Pt) is a major threat to wheat cultivation worldwide. The rapid evolution of this pathogen has led to the emergence of new virulent strains that can overcome the resistance of commonly cultivated wheat varieties. To address this thre...

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Main Authors: Jitendra Kumar Yadav, Shruti Sinha, Hariom Shukla, Ankur Singh, Tanmaya Kumar Sahu, Shailendra Kumar Jha, Jyoti Kumari, Manjusha Verma, Sundeep Kumar, Rakesh Singh, Gyanendra Pratap Singh, Amit Kumar Singh
Format: Article
Language:English
Published: BMC 2025-03-01
Series:BMC Plant Biology
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Online Access:https://doi.org/10.1186/s12870-025-06330-2
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