Analysis on Crack Mechanism of Passivation Layer in Power Packaging

Passivation crack on the surface of power chip seriously affects the reliability of power devices. In this paper, the mechanism of passivation layer failure was explored by temperature cycling test on D-PAK module. Temperature cycling tests showed that the cracks developed in the passivation film ov...

Full description

Saved in:
Bibliographic Details
Main Authors: Zhiwen CHEN, Xingwang HU, Yong LIU, Li LIU, Sheng LIU
Format: Article
Language:zho
Published: Editorial Department of Electric Drive for Locomotives 2021-09-01
Series:机车电传动
Subjects:
Online Access:http://edl.csrzic.com/thesisDetails#10.13890/j.issn.1000-128x.2021.05.025
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items