A Sequential-Interval Optimal Sampling Strategy Based on Reliability Prediction Under Wiener Process
For satellite electronic components characterized by high reliability and long lifespan, achieving improved efficiency in reliability prediction is essential when only a limited amount of data is available. Many studies have collected degradation data using uniform sampling strategies. In this work,...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-05-01
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| Series: | Mathematics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2227-7390/13/11/1817 |
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