Integrating Surface-related Indicators of Coverage, Distance and Distribution for Quantifying Scan-to-BIM Confidence Level
Scan-to-BIM is a widely-used approach to generate Building Information Modelling and by extension Digital Twin models in the architecture, engineering, and construction sector. The resulting models need to be as accurate as possible to ensure subsequent activities that make use of them can do so eff...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Copernicus Publications
2024-10-01
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| Series: | ISPRS Annals of the Photogrammetry, Remote Sensing and Spatial Information Sciences |
| Online Access: | https://isprs-annals.copernicus.org/articles/X-4-2024/223/2024/isprs-annals-X-4-2024-223-2024.pdf |
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