Automatic PID Control Strategy via Energy Dissipation for Tapping Mode Atomic Force Microscopy

This study presents an automatic PID control strategy for Tapping-Mode Atomic Force Microscopy (TM-AFM) that addresses the impacts of energy dissipation on tip–sample interactions. Our methodology integrates energy analysis to quantify the critical relationship between energy loss and phase lag dyna...

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Bibliographic Details
Main Authors: Yuan Zhao, Sha-Sha Xiao, Ji-Rui Liu, Sen Wu
Format: Article
Language:English
Published: MDPI AG 2025-07-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/25/14/4277
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