Automatic PID Control Strategy via Energy Dissipation for Tapping Mode Atomic Force Microscopy
This study presents an automatic PID control strategy for Tapping-Mode Atomic Force Microscopy (TM-AFM) that addresses the impacts of energy dissipation on tip–sample interactions. Our methodology integrates energy analysis to quantify the critical relationship between energy loss and phase lag dyna...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-07-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/25/14/4277 |
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