The Photoionization Processes of Deep Trap Levels in n-GaN Films Grown by MOVPE Technique on Ammono-GaN Substrates

In this paper, we present various theoretical models that accurately approximate the spectral density of the optical capture cross-section (<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><msubsup>&l...

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Bibliographic Details
Main Authors: Piotr Kruszewski, Konrad Sakowski, Krzysztof Gościński, Paweł Prystawko
Format: Article
Language:English
Published: MDPI AG 2024-09-01
Series:Applied Sciences
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Online Access:https://www.mdpi.com/2076-3417/14/19/8785
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