Non-perturbative cathodoluminescence microscopy of beam-sensitive materials

Non-perturbative cathodoluminescence microscopy of beam-sensitive materials

Cathodoluminescence microscopy is now a well-established and powerful tool for probing the photonic properties of nanoscale materials, but in many cases, nanophotonic materials are easily damaged by the electron-beam doses necessary to achieve reasonable cathodoluminescence signal-to-noise ratios. T...

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Bibliographic Details
Main Authors: Bogroff Malcolm, Cowley Gabriel, Nicastro Ariel, Levy David, Wu Yueh-Chun, Mao Nannan, Yang Tilo H., Zhang Tianyi, Kong Jing, Vasudevan Rama, Kelley Kyle P., Lawrie Benjamin J.
Format: Article
Language:English
Published: De Gruyter 2025-03-01
Series:Nanophotonics
Subjects:
color centers
2d materials
cathodoluminescence
Online Access:https://doi.org/10.1515/nanoph-2024-0724
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https://doi.org/10.1515/nanoph-2024-0724

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