Reliability Analysis of Transient Voltage Suppression Diodes Under Direct Current Switching Surge Stress
This study examined the dependability of Transient Voltage Suppression (TVS) diodes under direct current (DC) switching surge stress from several manufacturers with identical electrical requirements. To prevent thermal damage, we applied a standard 3 ms DC switching surge and increased the surge vol...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-03-01
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| Series: | Energies |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1996-1073/18/7/1725 |
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