Computational methods in nanometrology: the challenges of resolution and stochasticity
Nanometrology is vital for the advancement of nanotechnology but faces significant computational demands due to the complexity of measurements at the nanoscale. This review identifies two primary challenges: first, achieving super-resolution in microscopy imaging, where capturing detailed nanoscale...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Frontiers Media S.A.
2025-05-01
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| Series: | Frontiers in Nanotechnology |
| Subjects: | |
| Online Access: | https://www.frontiersin.org/articles/10.3389/fnano.2025.1559523/full |
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