Computational methods in nanometrology: the challenges of resolution and stochasticity

Nanometrology is vital for the advancement of nanotechnology but faces significant computational demands due to the complexity of measurements at the nanoscale. This review identifies two primary challenges: first, achieving super-resolution in microscopy imaging, where capturing detailed nanoscale...

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Bibliographic Details
Main Authors: Alex Kondi, Efi-Maria Papia, Eleni Stai, Vassilios Constantoudis
Format: Article
Language:English
Published: Frontiers Media S.A. 2025-05-01
Series:Frontiers in Nanotechnology
Subjects:
Online Access:https://www.frontiersin.org/articles/10.3389/fnano.2025.1559523/full
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