Robustness evaluation of electric field measurements via template matching in 4D-STEM

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Bibliographic Details
Main Authors:	Wartelle Alexis, Bryan Matthew, Lu Yiran, Cooper David, Rouvière Jean-Luc, den Hertog Martien
Format:	Article
Language:	English
Published:	EDP Sciences 2024-01-01
Series:	BIO Web of Conferences
Subjects:	4d-stem com template matching
Online Access:	https://www.bio-conferences.org/articles/bioconf/pdf/2024/48/bioconf_emc2024_24038.pdf
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