Fast and Accurate Cross-PVT Full-Chip Leakage Power Estimation With Multi-Task Learning
As semiconductor technology continues to scale, power consumption has become a primary focus of researchers and engineers. In particular, cross-PVT (Process, Voltage, and Temperature) full-chip leakage power estimation is urgently necessary, as it provides crucial guidance for power delivery network...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10985761/ |
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