Novel Gate Fabrication Process Enhancing High-Frequency Operation in AlGaN/GaN HEMTs for Ka-Band Applications

In this study, AlGaN/GaN high-electron-mobility-transistor (HEMTs) with a small gate length were fabricated using a stepper. Additionally, a novel gate fabrication process was conducted to shrink the gate head, thus reducing the parasitic capacitance of the device to achieve high-power amplifier per...

Full description

Saved in:
Bibliographic Details
Main Authors: Neng-Da Li, Yueh-Chin Lin, Kai-Wen Chen, Heng-Tung Hsu, Yi-Fan Tsao, Edward Yi Chang
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Online Access:https://ieeexplore.ieee.org/document/11062583/
Tags: Add Tag
No Tags, Be the first to tag this record!