Versatile Silicon‐Based Surface‐Enhanced Raman Spectroscopy Chip for Quantitative Sensing and Point‐of‐Care Applications

Versatile Silicon‐Based Surface‐Enhanced Raman Spectroscopy Chip for Quantitative Sensing and Point‐of‐Care Applications

Abstract This study presents the development of highly sensitive, uniform, and reproducible silicon‐based Surface‐Enhanced Raman Scattering (SERS) substrates using super‐aligned carbon nanotubes (SACNT) networks as an etching mask. These substrates have been scaled up to the wafer level, offering a...

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Bibliographic Details
Main Authors: Yuanhao Jin, Ji Wang, Lijuan Lin, Haitao Yang, Lihui Zhang, Shoushan Fan, Qunqing Li, Feng Xu
Format: Article
Language:English
Published: Wiley-VCH 2025-07-01
Series:Advanced Materials Interfaces
Subjects:
point‐of‐care test
silicon nanostructure
super‐aligned carbon nanotubes
surface‐enhanced Raman spectroscopy
Online Access:https://doi.org/10.1002/admi.202500375
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https://doi.org/10.1002/admi.202500375

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