Embedded implementation of phase imbalance faults in three-phase inverters: The impact of MOSFET conduction resistance variations
This work investigates the phase unbalance failures occurring on three-phase inverter, especially related to the variation of the Ron conduction resistance of the silicon carbide (SiC) MOSFET. These failures, caused by component degradation, aging, or thermal stress, affect the inverter performance,...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2025-06-01
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| Series: | Results in Engineering |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S259012302501299X |
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