Investigating the Impact of Sensor Layout on Radiation Hardness in 25 µm Pitch Hybrid Pixel Detectors for 4th Generation Synchrotron Light Sources

Investigating the Impact of Sensor Layout on Radiation Hardness in 25 µm Pitch Hybrid Pixel Detectors for 4th Generation Synchrotron Light Sources

With the evolution of synchrotron light sources to fourth generation (diffraction-limited storage rings), the brilliance is increased by several orders of magnitude compared to third generation facilities. For example, the Swiss Light Source (SLS) has been upgraded to SLS 2.0, promising a horizontal...

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Main Authors: Julian Heymes, Filippo Baruffaldi, Anna Bergamaschi, Martin Brückner, Maria Carulla, Roberto Dinapoli, Simon Ebner, Khalil Ferjaoui, Erik Fröjdh, Viveka Gautam, Dominic Greiffenberg, Shqipe Hasanaj, Viktoria Hinger, Thomas King, Pawel Kozłowski, Shuqi Li, Carlos Lopez-Cuenca, Alice Mazzoleni, Davide Mezza, Konstantinos Moustakas, Aldo Mozzanica, Martin Müller, Jonathan Mulvey, Jan Navrátil, Kirsty A. Paton, Christian Ruder, Bernd Schmitt, Patrick Sieberer, Dhanya Thattil, Xiangyu Xie, Jiaguo Zhang
Format: Article
Language:English
Published: MDPI AG 2025-05-01
Series:Sensors
Subjects:
hybrid pixel detectors
pixel sensor design
radiation hardness
irradiation
X-ray detector
sensor layout
Online Access:https://www.mdpi.com/1424-8220/25/11/3383
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