OPTICAL PROPERTIES OF THIN Cu FILMS AS A FUNCTION OF SUBSTRATE TEMPERATURE
Copper films (250 nm) deposited on glass substrates, at different substrate temperatures. Their optical properties were measured by ellipsometery (single wavelength of 589.3 nm) and spectrophotometery in the spectral range of 200–2600 nm. Kramers Kronig method was used for the analysis of the reflec...
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| Format: | Article |
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| Language: | English |
| Published: |
University of Tehran
2003-03-01
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| Series: | Journal of Sciences, Islamic Republic of Iran |
| Online Access: | https://jsciences.ut.ac.ir/article_31704_cafea64d0dfedfd1871a300bfcc616b5.pdf |
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