Modeling of Electron Mobility of GaN at Low Temperature and Low Electric Field

An analytical model at low temperature and low field electron mobility of GaN has been developed. The electron mobility in GaN have been calculated using Relaxation Time Approximation method considering elastic process of acoustic phonon deformation potential scattering, acoustic piezoelectric scatt...

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Main Authors: Souradeep Chakrabarti, Shyamasree Gupta Chatterjee, Somnath Chatterjee
Format: Article
Language:English
Published: Sumy State University 2011-01-01
Series:Журнал нано- та електронної фізики
Subjects:
Online Access:http://jnep.sumdu.edu.ua/download/numbers/2011/1,%20Part%205/articles/jnep_2011_V3_N1(Part5)_1071-1080.pdf
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author Souradeep Chakrabarti
Shyamasree Gupta Chatterjee
Somnath Chatterjee
author_facet Souradeep Chakrabarti
Shyamasree Gupta Chatterjee
Somnath Chatterjee
author_sort Souradeep Chakrabarti
collection DOAJ
description An analytical model at low temperature and low field electron mobility of GaN has been developed. The electron mobility in GaN have been calculated using Relaxation Time Approximation method considering elastic process of acoustic phonon deformation potential scattering, acoustic piezoelectric scattering and ionized impurity scattering, neutral impurity scattering, dislocation scattering. Ionized impurity scattering has been treated beyond the Born approximation using Dingle and Brooks- Herring analysis. The compensation ratio is used as a parameter with a realistic charge neutrality condition. Degeneracy is very important factor as it is used to imply different statistics (Maxwell – Boltzmann or Fermi – Dirac) at different temperature. Generalized M-B statistics are used throughout because the samples we have used to compare our results are highly Non-degenarate. The result shows that, the proposed model can accurately predict the electron mobility as a function of both the carrier concentration and the temperature upto 200 K. The discrepancy of this model above temperature 200 K presumably results from the following factors: ignoring the role of optical phonon, at low temperature consideration of parabolic band i.e. neglecting the effect of inter-velly scattering and ignoring the effect of very few interfacial charges in the degenerate layer at the GaN-substrate interface.
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institution OA Journals
issn 2077-6772
language English
publishDate 2011-01-01
publisher Sumy State University
record_format Article
series Журнал нано- та електронної фізики
spelling doaj-art-82d784eeb59947f6bfb5ac5cdaa86d342025-08-20T01:57:45ZengSumy State UniversityЖурнал нано- та електронної фізики2077-67722011-01-013110711080Modeling of Electron Mobility of GaN at Low Temperature and Low Electric FieldSouradeep ChakrabartiShyamasree Gupta ChatterjeeSomnath ChatterjeeAn analytical model at low temperature and low field electron mobility of GaN has been developed. The electron mobility in GaN have been calculated using Relaxation Time Approximation method considering elastic process of acoustic phonon deformation potential scattering, acoustic piezoelectric scattering and ionized impurity scattering, neutral impurity scattering, dislocation scattering. Ionized impurity scattering has been treated beyond the Born approximation using Dingle and Brooks- Herring analysis. The compensation ratio is used as a parameter with a realistic charge neutrality condition. Degeneracy is very important factor as it is used to imply different statistics (Maxwell – Boltzmann or Fermi – Dirac) at different temperature. Generalized M-B statistics are used throughout because the samples we have used to compare our results are highly Non-degenarate. The result shows that, the proposed model can accurately predict the electron mobility as a function of both the carrier concentration and the temperature upto 200 K. The discrepancy of this model above temperature 200 K presumably results from the following factors: ignoring the role of optical phonon, at low temperature consideration of parabolic band i.e. neglecting the effect of inter-velly scattering and ignoring the effect of very few interfacial charges in the degenerate layer at the GaN-substrate interface.http://jnep.sumdu.edu.ua/download/numbers/2011/1,%20Part%205/articles/jnep_2011_V3_N1(Part5)_1071-1080.pdfModeling of electron mobilityM-B statisticsDegeneracyLow temperature (2)Elastic scatteringsAcoustic phonon deformation potentialAcoustic phonon piezoelectricIonized impurityDislocation scatteringNeutral impurity.
spellingShingle Souradeep Chakrabarti
Shyamasree Gupta Chatterjee
Somnath Chatterjee
Modeling of Electron Mobility of GaN at Low Temperature and Low Electric Field
Журнал нано- та електронної фізики
Modeling of electron mobility
M-B statistics
Degeneracy
Low temperature (2)
Elastic scatterings
Acoustic phonon deformation potential
Acoustic phonon piezoelectric
Ionized impurity
Dislocation scattering
Neutral impurity.
title Modeling of Electron Mobility of GaN at Low Temperature and Low Electric Field
title_full Modeling of Electron Mobility of GaN at Low Temperature and Low Electric Field
title_fullStr Modeling of Electron Mobility of GaN at Low Temperature and Low Electric Field
title_full_unstemmed Modeling of Electron Mobility of GaN at Low Temperature and Low Electric Field
title_short Modeling of Electron Mobility of GaN at Low Temperature and Low Electric Field
title_sort modeling of electron mobility of gan at low temperature and low electric field
topic Modeling of electron mobility
M-B statistics
Degeneracy
Low temperature (2)
Elastic scatterings
Acoustic phonon deformation potential
Acoustic phonon piezoelectric
Ionized impurity
Dislocation scattering
Neutral impurity.
url http://jnep.sumdu.edu.ua/download/numbers/2011/1,%20Part%205/articles/jnep_2011_V3_N1(Part5)_1071-1080.pdf
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AT shyamasreeguptachatterjee modelingofelectronmobilityofganatlowtemperatureandlowelectricfield
AT somnathchatterjee modelingofelectronmobilityofganatlowtemperatureandlowelectricfield