SAMF-YOLO: A self-supervised, high-precision approach for defect detection in complex industrial environments.
As object detection models grow in complexity, balancing computational efficiency and feature expressiveness becomes a critical challenge. To address this, we propose SAMF-YOLO, a novel model integrating three key components: SONet, BFAM, and FASFF-Head. The UniRepLKNet backbone, enhanced by the Sta...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Public Library of Science (PLoS)
2025-01-01
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| Series: | PLoS ONE |
| Online Access: | https://doi.org/10.1371/journal.pone.0327001 |
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