High-efficiency ZOGAN blue micro-LEDs with superior thermal-stress reliability for ultra-high-resolution displays
Visible light-emitting-diode (LED) chips suffer from a problem called size-dependent droop (S-droop), which causes a decrease in external quantum efficiency (EQE) when the chip size decreases below a few tens of micrometers. The device reliability also degrades with the chip-size reduction. To addre...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2025-06-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/5.0276739 |
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