Error Correction Codes for Double Burst Errors Correction in Memories

This paper addresses the issue of double burst errors occurring in memories and presents the design of corresponding error correction codes (ECC). The proposed ECCs can correct up to two burst errors simultaneously, each up to 4-bit. The errors’ positions are randomly distributed across a...

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Bibliographic Details
Main Authors: He Liu, Liyi Xiao, Tianqi Wang, Jiaqiang Li, Jie Li
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/11072165/
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